HomeCreate LabelE-Invoice CheckNewExport CustomsFreight QuotePricingReturn LabelsTrackingHS CodeHelpAPI Docs
You can create labels without registration, but addresses won’t be saved. Create an account to reuse saved addresses.
HS code / TARIC details
9030820000 - For measuring or checking semiconductor wafers or devices (including integrated circuits)
DeclarableNo supplementary unitDuty hint: 0.000%Official TARIC lookup
Definition & language versions
For measuring or checking semiconductor wafers or devices (including integrated circuits)
Tip: confirm material, use and finished-product form first, then compare hierarchy and declarable candidates below.
ZH
测量或检验半导体晶圆或器件(包括集成电路)的仪器及装置
DE
zum Messen oder Prüfen von Halbleiterscheiben (wafers) oder Halbleiterbauelementen (einschließlich integrierter Schaltungen)
EN
For measuring or checking semiconductor wafers or devices (including integrated circuits)
Classification hints
This code appears to be a directly declarable leaf candidate and can be used for the next customs-filing step.
Please check validity dates and duty effective dates, as the applicable rule may depend on the filing date.
Trade measures and restrictions
This block shows a filing-oriented summary first, then imported TARIC measures including scope, add. codes, order numbers, duty expressions and legal bases.
Open official TARIC
Imported measures: 1Country-scoped: 1With add. code/order: 0
Measure
Current value
Notes / validity
Reference import duty
0.000%
Effective from Mon Jan 01
Legal base
Regulation 2448/95
-
Supplementary unit
Not required
Validity: Mon Jan 01 - -
Imported TARIC measures
Measure
Scope
Duty / codes
Validity
Legal base
Import control on restricted goods and technologies
711
North Korea (Democratic People’s Republic of Korea)
Cond: Y cert: Y-920 (29):; Y (09):
Fri Sep 01 - -
Regulation 1509/17
This page provides public lookup and helper information only and is not customs/tax/legal advice. Official TARIC/EZT sources prevail.
TARIC change hints
After a monthly TARIC update, this block shows a hint about text changes versus the previous snapshot.
New code
Source: internal TARIC diff (hint only)
Previous
No previous text
→
Current
zum Messen oder Prüfen von Halbleiterscheiben (wafers) oder Halbleiterbauelementen (einschließlich integrierter Schaltun
Type: newSource lang: EN+DE
Next actions
If this code looks suitable for your product, continue with shipment creation or customs-entry forms.